Introduction to Transmission Electron Microscopy (TEM) for AHERA (1409), June 18–20, 2024 In-Person New course

This three-day course will be taught by Dr. Thomas A. Kubic and conducted in-person in Chicago. For more details, email registrar@mcri.org.
COURSE OUTLINE & SYLLABUS
Course schedule: 8:00 a.m. – 5:00 p.m. all three days.
The course will consist of lectures and problem exercises. Includes AHERA Method, X-Ray Spectroscopy, Electron Diffraction and Sample Preparation discussions ONLY (No Actual Sample Preparation). There is no prerequisite for this course.
Topics will include:

1. The AHERA Methodology

Sample submission requirement, types of structures and counting, concentration calculations, completion of response action determination, calibrations, morphology and analytical analysis (morphology, chemistry, and diffraction).

2. The analytical transmission electron microscope (ATEM)

How an ATEM works: source, beam and interactions, nature of accelerated electrons, lenses, and imaging.

3. X-ray spectrometry

Generation and detection of X-rays in an ATEM. Detectors (SiLi, and SDD), multichannel analyzers, basic signal processing, spectral artifacts.

4. Electron Diffraction

Origin of diffraction, Bragg’s law, von Laue equations, Ewald (Reflection Sphere), diffraction of electrons (small angles), six crystal types, asbestos crystals, Zones, and Zone axes, forbidden reflections, twinning, crystallographic planes and Miller indices.

Indexing Zone Patterns for identification of phases from diffraction with elemental composition. Use of reference data (Drs. Su and Emma)