The Preparation of Tape Lift Samples for the Study of Subvisible and Nanoparticles
THE MICROSCOPE
2024, Volume 71:2, pp. 69–76
DOI
https://doi.org/10.59082/KGWG5997
AUTHOR
Christopher S. Palenik
ABSTRACT
Tape lifts are commonly used as a substrate for the collection of microscopic trace evidence. While traces such as fibers, glass, and paint can generally be readily recognized by stereomicroscopy, these larger particles often represent a minor, to trace fraction of the total particulate load on a given lift. In contrast, smaller particles (broadly categorized as dust), which are frequently the dominant component on the tape, are less commonly exploited as forensic evidence. These particles, which for the purposes of this article, may range in size from hundreds of micrometers down to nanometers (i.e., subvisible) are difficult, or sometimes impossible to see, much less characterize, by stereomicroscopy. Such particles also present challenges to isolate, manipulate, and analyze. In addition, when collected on tape lifts, as is the case in many forensic examinations, such particles become trapped in an adhesive matrix, further complicating attempts to isolate all but the largest particles for subsequent analyses.